Very Low Energy Scanning Electron Microscopy of Free-Standing Ultrathin Films

0340747 - ÚPT 2010 RIV JP eng J - Journal Article
Müllerová, Ilona - Hovorka, Miloš - Hanzlíková, Renáta - Frank, Luděk
Very Low Energy Scanning Electron Microscopy of Free-Standing Ultrathin Films.
Materials Transactions. Roč. 51, č. 2 (2010), s. 265-270. ISSN 1345-9678. E-ISSN 1347-5320
R&D Projects: GA AV ČR IAA100650902
Institutional research plan: CEZ:AV0Z20650511
Keywords : low energy scanning electron microscopy * thin foils * transmission of very slow electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 0.779, year: 2010
http://www.jim.or.jp/journal/e/51/02/265.html

Instrument and methodology is presented for very low energy scanning transmission electron microscopy. The detector system provides simultaneous acquisitions of total reflected and transmitted electron fluxes. Introductory experiments incorporated examination of ultrathin foils of gold, carbon and graphene flakes. Extremely sensitive thickness contrast obtained at units of eV is demonstrated. The phenomenon of electron transmissivity apparently exceeding 100% owing to the contribution of secondary electrons released near to the exit surface is described and discussed.
Permanent Link: http://hdl.handle.net/11104/0183928