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New insights on atomic-resolution frequency-modulation Kelvin-probe force-microscopy imaging of semiconductors
- 1.0339531 - FZÚ 2010 RIV US eng J - Journal Article
Sadewasser, S. - Jelínek, Pavel - Fang, Ch.-K. - Custance, Ó. - Yamada, Y. - Sugimoto, Y. - Abe, M. - Morita, S.
New insights on atomic-resolution frequency-modulation Kelvin-probe force-microscopy imaging of semiconductors.
Physical Review Letters. Roč. 103, č. 26 (2009), 266103/1-266103/4. ISSN 0031-9007. E-ISSN 1079-7114
R&D Projects: GA ČR GA202/09/0545; GA AV ČR IAA100100905
Institutional research plan: CEZ:AV0Z10100521
Keywords : KPFM * atomic force microscopy * DFT * atomic resolution * semiconductor surface
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 7.328, year: 2009
We present dynamic force-microscopy experiment and first-principles simulations that contribute to clarify the origin of atomic-scale contrast in Kelvin-probe force-microscopy (KPFM) images of semiconductor surfaces.
Permanent Link: http://hdl.handle.net/11104/0183034
Number of the records: 1