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Advanced x-ray optics with Si wafers and slumped glass
- 1.0337793 - ASÚ 2015 RIV US eng C - Conference Paper (international conference)
Hudec, René - Maršíková, V. - Míka, M. - Sik, J. - Lorenz, M. - Pína, L. - Inneman, A. - Skulinová, Michaela
Advanced x-ray optics with Si wafers and slumped glass.
Optics for EUV, X-Ray, and Gamma-Ray Astronomy IV. Bellingham: SPIE, 2009 - (O'Dell, S.), 74370S-1-74370S-12. Proceedings of the SPIE, 7437. ISBN 9780819477279. ISSN 0277-786X.
[Optics for EUV, X-Ray, and Gamma-Ray Astronomy /4./. San Diego (US), 31.08.2009-31.08.2009]
R&D Projects: GA ČR GP202/07/P510
Institutional research plan: CEZ:AV0Z10030501
Keywords : x-ray optics * Si wafers
Subject RIV: BN - Astronomy, Celestial Mechanics, Astrophysics
http://dx.doi.org/10.1117/12.827978
We report on the continuation of the development of test samples of astronomical x-ray optics based on thermally formed glass foils and on bent Si wafers.
Permanent Link: http://hdl.handle.net/11104/0181714
Number of the records: 1