Coincidence imaging System with Electron Optics

0336841 - ÚPT 2011 RIV CZ eng C - Conference Paper (international conference)
Kroupa, M. - Jakoubek, J. - Krejčí, E. - Valach, O. - Horáček, Miroslav - Radlička, Tomáš - Vlček, Ivan
Coincidence imaging System with Electron Optics.
11th International Workshop on Radiation Imaging Detectors. Praha: CTU Press, 2009, II-88. ISBN 978-80-01-04378-3.
[International workshop on radiation imaging detectors /11./. Praha (CZ), 26.06.2009-02.07.2009]
Institutional research plan: CEZ:AV0Z20650511
Keywords : instrumental neutron activation analysis * Timepix * coincidence imaging system
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering

Instrumental neutron activation analysis (INAA) is a widely used method for elemental analysis. After the sample is put into a neutron field, where nuclei of interest become activated, these nuclei emit gamma photons with characteristic energies for each element. By measuring gamma spectrum of the activated sample one can determine the sample elemental composition with very high precision. In order to find out the spatial distribution of elements, the sample is usually cut into pieces, which are examined individually. Such procedure is time consuming and the spatial resolution is limited by the size of the pieces. This contribution follows up the work where the semiconductor pixel detector Timepix was used for revealing the concentration and distribution of certain elements in a whole sample at once (imaging coincidence INAA) [1]. Photons detected by a standard semiconductor detector were used to trigger the Timepix device which detected the accompanying electrons.
Permanent Link: http://hdl.handle.net/11104/0180986