Number of the records: 1
Core level photoemission and STM characterization of Ta/Si(111)-7x7 interfaces
- 1.0336680 - FZÚ 2010 RIV NL eng J - Journal Article
Shukrynau, Pavel - Dudr, Viktor - Švec, Martin - Vondráček, Martin - Mutombo, Pingo - Skála, T. - Šutara, F. - Matolín, V. - Prince, K. C. - Cháb, Vladimír
Core level photoemission and STM characterization of Ta/Si(111)-7x7 interfaces.
[Fotoemise z vnitřních hladin a STM charakterizace rozhraní Ta/Si(111)-7x7.]
Surface Science. Roč. 603, č. 3 (2009), s. 469-476. ISSN 0039-6028. E-ISSN 1879-2758
R&D Projects: GA AV ČR IAA1010413
Institutional research plan: CEZ:AV0Z10100521
Keywords : tantalum * silicon * silicide * aAdsorption * photoelectron spectroscopy * scanning tunneling microscopy
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 1.798, year: 2009
We present the results of scanning tunneling microscopy (STM) and photoemission spectroscopy (PES) of the Ta/Si(111)-7x7 system after deposition of Ta at substrate temperatures from 300 to 1250 K.
Byly prezentovány výsledky STM a fotoemisní spektroskopie Ta/Si(111)-7x7 systému po depozici tantalu na substrátu při teplotách od 300 - 1250 K.
Permanent Link: http://hdl.handle.net/11104/0180865
Number of the records: 1