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Transmission of Electrons through Thin Films by Scanning Low Energy Electron Microscopy
- 1.0335296 - ÚPT 2011 RIV CZ eng C - Conference Paper (international conference)
Müllerová, Ilona - Hovorka, Miloš - Fořt, Tomáš - Frank, Luděk
Transmission of Electrons through Thin Films by Scanning Low Energy Electron Microscopy.
Proceedings of the 4th Czech-Japan-China Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology (CJCS’09). Brno: ISI AS CR, 2009 - (Pokorná, Z.; Mika, F.), s. 22. ISBN 978-80-254-4535-8.
[CJCS’09 - Czech-Japan-China Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology /4./. Brno (CZ), 10.08.2009-14.08.2009]
R&D Projects: GA AV ČR IAA100650902
Institutional research plan: CEZ:AV0Z20650511
Keywords : transmission electron microscope * scanning low energy electron microscopes
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
For examination of thin films by transmitted electrons (TE) the Transmission Electron Microscope is used at primary beam energies in hundreds of keV. The Scanning Electron Microscopes (SEM) utilize reflected electrons in order to image surfaces but recently the TE mode has been introduced into SEM at much lower electron energies.
Permanent Link: http://hdl.handle.net/11104/0179802
Number of the records: 1