Cathodoluminescence study of electron beam formed defects in polysilanes

0335270 - ÚPT 2010 RIV AT eng C - Conference Paper (international conference)
Schauer, P. - Schauer, Petr - Kuřitka, I. - Nešpůrek, Stanislav
Cathodoluminescence study of electron beam formed defects in polysilanes.
MC 2009 - Microscopy Conference: First Joint Meeting of Dreiländertagung and Multinational Conference on Microscopy. Graz: Verlag der Technischen Universität, 2009, Vol. 3: 383-384. ISBN 978-3-85125-062-6.
[MC 2009 - Joint Meeting of Dreiländertagung and Multinational Congress on Microscopy /9./. Graz (AT), 30.08.2009-04.09.2009]
R&D Projects: GA AV ČR IAA100100622
Institutional research plan: CEZ:AV0Z20650511; CEZ:AV0Z40500505
Keywords : cathodoluminescence * electron beam degradation * poly[methyl(phenyl)silane] * PMPSi * silicon polymers
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://www.univie.ac.at/asem/Graz_MC_09/papers/55161.pdf

In materials science and semiconductor engineering, cathodoluminescence (CL) is a very efficient tool for the study of electronic substance structure and application possibilities. In spite of this, CL is only very rarely used for investigation of polymers. Recently Wellman et al introduced CL as an important tool for the investigation of materials for organic electroluminescence devices. It is evident that CL may become a strong tool for the investigation of polymer light emission possibilities as well as for investigation of triplet harvester organic solar cells. Our interest has been focused on the group of polysilanes (often also called polysilylanes), especially on poly[methyl(phenyl)silane] (PMPSi), having linear backbone of linked silicon atoms. Cathodoluminescence study of electron beam formed defects in PMPSi is presented in this paper.
Permanent Link: http://hdl.handle.net/11104/0179779