Characterisation of Ni+ implanted PEEK, PET and PI

0324684 - ÚJF 2009 RIV NL eng J - Journal Article
Macková, Anna - Bočan, Jiří - Khaibulline, R. - Valeev, V. F. - Slepička, P. - Sajdl, P. - Švorčík, V.
Characterisation of Ni+ implanted PEEK, PET and PI.
[Charakterizace polymerů PEEK, PET a PI implantovaných Ni+ ionty.]
Nuclear Instruments & Methods in Physics Research Section B. Roč. 267, - (2009), s. 1549-1552. ISSN 0168-583X. E-ISSN 1872-9584
R&D Projects: GA MŠMT(CZ) LC06041; GA AV ČR(CZ) KJB100480601
Institutional research plan: CEZ:AV0Z10480505
Keywords : Ion implantation * Polymers * TRIDYN * RBS * XPS * Depth profiles
Subject RIV: BG - Nuclear, Atomic and Molecular Physics, Colliders
Impact factor: 1.156, year: 2009

Polyimide (PI), polyetheretherketone (PEEK) and polyethyleneterephthalate (PET) were implanted with 40 keV Ni+ ions at room temperature at fluences ranging from 10^16 to 1.5x10^17 ions cm-2. The depth profiles of the implanted Ni atoms were determined by the RBS technique and compared with those predicted by the SRIM and TRIDYN codes. Hydrogen depletion as a function of the ion fluence was determined by the ERDA technique, and the compositional and structural changes of the polymers were characterised by the UV–vis and XPS methods. The implanted profiles differed significantly from those predicted by the SRIM code while the lower fluences were satisfactorily described by the TRIDYN simulation. A significant hydrogen release from the polymer surface layer was observed along with significant changes in the surface layer composition. The UV–vis results indicated an increase of the concentration of double bonds, XPS showed increasing concentration Ni0+ with the increasing ion fluence.

Polymery polyimid (PI), polyetereterketon (PEEK) a polyetyléntereftalát (PET) byly implantovány Ni+ ionty s energií 40 keV a při tocích od 10^16 do 1.5x10^17 iontů/cm2. Hloubkové profily implantovaných Ni atomů byly analyzovány metodou RBS a srovnávány se simulacemi programy SRIM a TRIDYN. Úbytek vodíku byl sledován v závislosti na toku iontů metodou ERDA a změny struktury a chemického složení byly rovněž analyzovány UV-vis spektroskopií a metodou XPS. Profily implantovaných dopantů se lišily signifikantně od profilů simulovaných s využitím SRIM, TRIDYN uspokojivě interpretoval hloubkové profily Ni pro nižší implantační toky. UV-vis spektroskopie identikovala zvýšenou koncentraci dvojných vazeb, XPS koncentraci Ni0+ v souvislosti s rostoucím tokem Ni+ iontů.
Permanent Link: http://hdl.handle.net/11104/0172315