Doubly charged ion emission in sputtering of monocrystalline fluorides

0303940 - URE-Y 20020020 RIV NL eng J - Journal Article
Lörinčík, Jan - Šroubek, Zdeněk
Doubly charged ion emission in sputtering of monocrystalline fluorides.
Nuclear Instruments & Methods in Physics Research Section B. Roč. 187, č. 4 (2002), s. 447-450. ISSN 0168-583X. E-ISSN 1872-9584.
[Atomic Collisions in Solids ICACS /19./. Paris, 29.07.2001-03.08.2001]
R&D Projects: GA AV ČR IAA1067801; GA ČR GA202/99/0881
Institutional research plan: CEZ:AV0Z2067918
Keywords : sputtering * molecular electronic states * secondary ion emission
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 1.158, year: 2002

Sputtering of monocrystalline CeF₃, LaF₃ (doped with Eu), CaF₂, and CaCeF₂ surfaces by Ar.sup.+.sup. ions with impact energies 500 - 5000 eV has been performed. The emission of Ce.sup.+.sup., Ce.sup.++.sup., La.sup.+.sup., La.sup.++.sup., Eu.sup.+.sup., Eu.sup.++.sup., Ca.sup.+.sup., Ca.sup.++.sup., and F.sup.+.sup. has been investigated by a quadrupole SIMS.
Permanent Link: http://hdl.handle.net/11104/0114084