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Quasistatic capacitance-voltage characteristics of plane-parallel structures: Metal/semi-insulator/metal

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    0303745 - URE-Y 20000130 RIV US eng J - Journal Article
    Žďánský, Karel
    Quasistatic capacitance-voltage characteristics of plane-parallel structures: Metal/semi-insulator/metal.
    Journal of Applied Physics. Roč. 88, č. 4 (2000), s. 2024-2029. ISSN 0021-8979. E-ISSN 1089-7550
    Grant - others:AV ČR(CZ) KSK1010601 Projekt 7/96/K:4074; EU(XE) PECO 93
    Institutional research plan: CEZ:AV0Z2067918
    Keywords : semiconductors * insulators * capacitance
    Subject RIV: BM - Solid Matter Physics ; Magnetism
    Impact factor: 2.180, year: 2000

    Quasistatic capacitance-voltage characteristics of plane-parallel structures of the semi-insulating GaAs with two metal contacts are calculated numerically. Under consideration is the relaxation regime for the charge transport in the semi-insulator. We analyze metal/semi-insulator/metal structures for various parameters of the metal contacts and of the semi-insulator. A more detailed analysis is performed for the following structure: p-type like metal contact/n-type semi-insulator/n-type like metal contact.
    Permanent Link: http://hdl.handle.net/11104/0113932

     
     

Number of the records: 1  

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