Scanning vector Hall probe microscope

0205719 - UPT-D 20030102 RIV US eng J - Journal Article
Fedor, J. - Cambel, V. - Gregušová, D. - Hanzelka, Pavel - Dérer, J. - Volko, J.
Scanning vector Hall probe microscope.
Review of Scientific Instruments. Roč. 74, č. 12 (2003), s. 5105 - 5110. ISSN 0034-6748. E-ISSN 1089-7623
Institutional research plan: CEZ:AV0Z2065902
Keywords : VHPM * Hall sensor * Helium cryostat
Subject RIV: JB - Sensors, Measurment, Regulation
Impact factor: 1.343, year: 2003
http://web.ebscohost.com/ehost/pdf?vid=8&hid=115&sid=a7c0555a-21f4-4932-b1c6-a308ac4dd50b%40sessionmgr2

We present a scanning vector Hall probe microscope for imaging the entire magnetic field vector in close proximity to magnetic and superconducting samples. The microscope combines a large scanned area and a high space resolution of the magnetic field vector measured. A special feature of the equipment is a vacuum-tight sample space connected with a moving system via a flexible metal bellows. The microscope is based on a vector Hall sensor that consists of three separate Hall probes of an active area 5x5 .mu.m², patterned on three sides of a GaAs pyramid. The top of the pyramid serves as a tunneling contact and helps to control the sensorůsample separation. The sensor and the sample are placed in a helium cryostat with a temperature control in the range 10ů300 K. The sensor scans an area up to 5x5 mm² in the whole temperature interval with a spatial resolution ~5 .mu.m.
Permanent Link: http://hdl.handle.net/11104/0101332