0192659 - UOCHB-X 970001 RIV NL eng J - Journal Article
Tykva, Richard - Kopešťanský, Josef
The Noise Reduction of Silicon Detectors by Wafer Analyses and Technological Procedures.
Nuclear Instruments & Methods in Physics Research Section A. Roč. 380, - (1996), s. 198-200. ISSN 0168-9002. E-ISSN 1872-9576
R&D Projects: GA ČR GA206/93/0333; GA ČR GA206/93/1098
Impact factor: 1.038, year: 1996
Permanent Link: http://hdl.handle.net/11104/0088384