0185043 - UJF-V 20000213 RIV DE eng J - Journal Article
Švorčík, V. - Tichá, H. - Rybka, V. - Hnatowicz, Vladimír
Characterization of polymeric films by ellipsometry.
Journal of Materials Science Letters. Roč. 19, - (2000), s. 679-681. ISSN 0261-8028
Institutional research plan: CEZ:AV0Z1048901
Subject RIV: BG - Nuclear, Atomic and Molecular Physics, Colliders
Impact factor: 0.496, year: 2000

The reflection and transmission ellipsometry is used for characterization of poly(ethyleneterephtalate), polyethylene andpolystyrene thin films. The dependence of ellipsometric parameters .psí. and .DELTA. on the polarity, orientation and thickness of the film is determined. From the reflection measurement data the relative permittivity and refractive index ofpolymers is determined.
Permanent Link: http://hdl.handle.net/11104/0081465