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Applications of the AFM in Institute of Physics

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    0134319 - FZU-D 20030215 RIV CZ eng J - Journal Article
    Drbohlav, Ivo
    Applications of the AFM in Institute of Physics.
    Jemná mechanika a optika. Roč. 47, 6-7 (2002), s. 214-215. ISSN 0447-6441
    Institutional research plan: CEZ:AV0Z1010914
    Keywords : AFM * surface structure * quantum dots * polycrystalline silicon * optoelectronic materials
    Subject RIV: BM - Solid Matter Physics ; Magnetism

    Some of the last activities of the Institute of Physics of CAS using the atomic force microscopy are described. The activities were focused namely on the study of quantum dots prepared by means of the LP-MOVPE technology and surfaces of some other materials (e.g. LiNbO3 and polycrystalline Si) as well.
    Permanent Link: http://hdl.handle.net/11104/0032225

     
     

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