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Characterization of Phase Transitions in PZT Ferroelectric films with spectral Ellipsometry

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    0134091 - FZU-D 20020380 RIV CZ eng J - Journal Article
    Deineka, Alexander - Suchaneck, G. - Jastrabík, Lubomír - Gerlach, G.
    Characterization of Phase Transitions in PZT Ferroelectric films with spectral Ellipsometry.
    Jemná mechanika a optika. 11-12, - (2002), s. 377-380. ISSN 0447-6441
    R&D Projects: GA MŠk LN00A015; GA ČR GA202/00/1425
    Institutional research plan: CEZ:AV0Z1010921
    Keywords : ferroelectric film * phase transition * film profile
    Subject RIV: BH - Optics, Masers, Lasers

    In this work, high temperature ellipsometric investigations of the PbZr0.235Ti0.765O3(PTZ) films prepared with different techniques are summarized with regard to recently obtained phase transitons at elevated temperatures belw the Curie point. The temperature dependences of the refractive index at fixed wavelenghts, refractive index profiles, and temperature dependence of optical gapare described.
    Permanent Link: http://hdl.handle.net/11104/0032028
     

Number of the records: 1