Electron yield from Be-Cu induced by highly charged Xe q+ ions

0133977 - FZU-D 20020265 RIV NL eng J - Journal Article
Krása, Josef - Láska, Leoš - Stöckli, M. P. - Fehrenbach, C. W.
Electron yield from Be-Cu induced by highly charged Xe q+ ions.
Nuclear Instruments & Methods in Physics Research Section B. Roč. 196, - (2002), s. 61-67. ISSN 0168-583X. E-ISSN 1872-9584
R&D Projects: GA AV ČR IAA1010105; GA MŠMT LN00A100
Institutional research plan: CEZ:AV0Z1010921
Keywords : highly charged ion-induced electron emission * angle impact effect * Be-Cu
Subject RIV: BH - Optics, Masers, Lasers
Impact factor: 1.158, year: 2002

The total electron yield, gamma, for emission of electrons induced by impact of Xe^q+ (8óqó28) ions with kinetic energy per charge E_i/q from 5 to 150keV/q on clean Be-Cu is presented for the impact angle, é, ranging from 0^o to 60^o.The é-dependences are analyzed with the use of the relation, which can distinguish above- and below-surface electron emission.
Permanent Link: http://hdl.handle.net/11104/0031924