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Initial stages of Cu/Si interface formation

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    0133801 - FZU-D 20020081 RIV NL eng J - Journal Article
    Savchenkov, Aleksei - Shukrinov, Pavel - Mutombo, Pingo - Slezák, J. - Cháb, Vladimír
    Initial stages of Cu/Si interface formation.
    Surface Science. 507-510, - (2002), s. 889-894. ISSN 0039-6028. E-ISSN 1879-2758
    R&D Projects: GA ČR GA202/99/P001; GA ČR GV202/98/K002
    Institutional research plan: CEZ:AV0Z1010914
    Keywords : copper * surface chemical reaction * scanning tunneling microscopy * surface segregation * silicon
    Subject RIV: BM - Solid Matter Physics ; Magnetism
    Impact factor: 2.140, year: 2002

    The adsorption of Cu atoms on a Si(111)-7 x 7 surface was studied using scanning tunnelling microscopy. The flash up to ~550 řC stimulates a reaction leading to massive re-arrangement of the surface resulting in the formation of 7 x 7 domains separated by disordered regions.
    Permanent Link: http://hdl.handle.net/11104/0031757

     
     

Number of the records: 1  

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