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X-ray diffraction on Si single crystal with a W-shaped longitudinal groove

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    0133408 - FZU-D 20010258 RIV DK eng J - Journal Article
    Artemiev, Nikolai - Busetto, E. - Hrdý, Jaromír - Pacherová, Oliva - Snigirev, A. - Suvorov, A.
    X-ray diffraction on Si single crystal with a W-shaped longitudinal groove.
    Journal of Synchrotron Radiation. Roč. 7, - (2000), s. 382-385. ISSN 0909-0495. E-ISSN 1600-5775
    R&D Projects: GA MŠMT OK 305; GA MPO PZ-CH/22/97
    Institutional research plan: CEZ:AV0Z1010914
    Keywords : X-ray optics * X-ray crystal monochromators * inclined diffration
    Subject RIV: BM - Solid Matter Physics ; Magnetism
    Impact factor: 0.924, year: 2000

    The measurement of sagittal deviation of an x-ray beam diffracted on the inclined surface of an Si/111/ single crystal was performed on BM5 in ESRF. The results agree with theory published earlier.
    Permanent Link: http://hdl.handle.net/11104/0031377

     
     

Number of the records: 1  

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