0133405 - FZU-D 20010203 RIV GB eng J - Journal Article
Švrček, Vladimír - Pelant, Ivan - Kočka, Jan - Fejfar, Antonín - Toušek, J. - Kondo, M. - Matsuda, A.
A new approach to surface photovoltage measurements on hydrogenated microcrystalline silicon layers.
Philosophical Magazine Letters. Roč. 81, č. 6 (2001), s. 405-410. ISSN 0950-0839. E-ISSN 1362-3036
R&D Projects: GA ČR GA202/98/0669; GA AV ČR IAA1010809
Institutional research plan: CEZ:A02/98:Z1-010-914
Keywords : surface photvoltage * microcrystalline silicon * diffusion length
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 1.346, year: 2001

A new approach to the surface photovoltage method is demonstrated on thick undoped microcrystalline silicon films grown on different substrates.
Permanent Link: http://hdl.handle.net/11104/0031374