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Carrier diffusion in microcrystalline silicon studied by the picosecond laser induced grating technique

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    0133390 - FZU-D 20010187 RIV US eng J - Journal Article
    Kudrna, J. - Trojánek, F. - Malý, P. - Pelant, Ivan
    Carrier diffusion in microcrystalline silicon studied by the picosecond laser induced grating technique.
    Applied Physics Letters. Roč. 79, č. 5 (2001), s. 626-628. ISSN 0003-6951. E-ISSN 1077-3118
    R&D Projects: GA AV ČR IAA1010809; GA AV ČR IAB2949101
    Grant - others:GA UK(XC) 180/99
    Institutional research plan: CEZ:A02/98:Z1-010-914
    Keywords : microcrysralline silicon * carrier diffusion
    Subject RIV: BM - Solid Matter Physics ; Magnetism
    Impact factor: 3.849, year: 2001

    We report on the picosecond laser induced grating technique applied to hydrogenated microcrystalline silicon and aimed at studying the photocarrier diffusion coefficient.
    Permanent Link: http://hdl.handle.net/11104/0031359

     
     

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