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Carrier diffusion in microcrystalline silicon studied by the picosecond laser induced grating technique
- 1.0133390 - FZU-D 20010187 RIV US eng J - Journal Article
Kudrna, J. - Trojánek, F. - Malý, P. - Pelant, Ivan
Carrier diffusion in microcrystalline silicon studied by the picosecond laser induced grating technique.
Applied Physics Letters. Roč. 79, č. 5 (2001), s. 626-628. ISSN 0003-6951. E-ISSN 1077-3118
R&D Projects: GA AV ČR IAA1010809; GA AV ČR IAB2949101
Grant - others:GA UK(XC) 180/99
Institutional research plan: CEZ:A02/98:Z1-010-914
Keywords : microcrysralline silicon * carrier diffusion
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 3.849, year: 2001
We report on the picosecond laser induced grating technique applied to hydrogenated microcrystalline silicon and aimed at studying the photocarrier diffusion coefficient.
Permanent Link: http://hdl.handle.net/11104/0031359
Number of the records: 1