0133333 - FZU-D 20010128 RIV CZ eng J - Journal Article
Deineka, Alexander - Jastrabík, Lubomír - Soukup, Ladislav
Ellipsometry non-destructive technique for PZT thin films investigations.
Jemná mechanika a optika. 11-12, - (2000), s. 329-331. ISSN 0447-6441
R&D Projects: GA MŠMT LN00A015
Institutional research plan: CEZ:AV0Z1010914
Keywords : PZT * J.A. Wollam spectral ellipsometer * refractive index depth profiels
Subject RIV: BM - Solid Matter Physics ; Magnetism

Thin PZT perovskire/pyrochlore stacks were studied with a J. A. Wollam spectral ellipsometer. The refractive index depth profiles were calculated from ellipsometric data. The "graded layer" model with functional dependence of refractive index was used.
Permanent Link: http://hdl.handle.net/11104/0031308