0133126 - FZU-D 20000500 RIV US eng C - Conference Paper (international conference)
Čerňanský, Marian
Restortion and processing of physical profiles from measured data.
Defect and Microstructure Analysis by Diffraction. New York: Int. Union of Crystallography, Oxford University Press, 1999 - (Snyder, R.; Fiala, J.; Bunge, H.), s. 613-646. ISBN 019-850-1897.
[Saiz strain "95"-X-Ray Powder Diffusion Analysis of Real Structure of Mater International Conference. Liptovský Mikuláš (SR), 21.08.1995-25.08.1995]
R&D Projects: GA ČR GA202/96/1685
Subject RIV: BM - Solid Matter Physics ; Magnetism

State of the art evolution techniques for restorting (deconvolution of) physical patterns from the measured diffraction profiles, background subtraction, smoothing and interpolation, Fourier techniques, iterative solutions of integral equations, inverse filtering, regularisation and maximum entropy methods, maximum likelihood and Bayesian methods are discussed in detail.
Permanent Link: http://hdl.handle.net/11104/0031113