0132467 - FZU-D 990417 RIV NL eng J - Journal Article
Ossadnik, Ch. - Vepřek, S. - Gregora, Ivan
Applicability of raman scattering for the characterization of nanocrystalline silicon.
Thin Solid Films. Roč. 337, - (1999), s. 148-151. ISSN 0040-6090. E-ISSN 1879-2731
Institutional research plan: CEZ:AV0Z1010914
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 1.101, year: 1999
Permanent Link: http://hdl.handle.net/11104/0030490