0132433 - FZU-D 990383 RIV US eng J - Journal Article
Rezek, Bohuslav - Stuchlík, Jiří - Fejfar, Antonín - Kočka, Jan
Local characterization of electronic transport in microcrystalline silicon thin films with submicron resolution.
Applied Physics Letters. Roč. 74, - (1999), s. 1475-1477. ISSN 0003-6951. E-ISSN 1077-3118
R&D Projects: GA AV ČR KSK1010601
Institutional research plan: CEZ:AV0Z1010914
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 4.184, year: 1999
Permanent Link: http://hdl.handle.net/11104/0030459