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Temperature dependence of metrological characteristics of quantum Hall effect samples

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    0131601 - FZU-D 980665 RIV US eng C - Conference Paper (international conference)
    Svoboda, Pavel - Vašek, Petr - Boháček, J.
    Temperature dependence of metrological characteristics of quantum Hall effect samples.
    Conference Proceeding IMTC/98 "Where Instrumentation is Going?". Vol. 2. New York: IEEE, 1998, s. 1254-1256. ISBN 0-7803-4797-8.
    [IEEE Instrumentation and Measurement Technology Conference 1998. St. Paul, Minnesota (US), 18.05.1998-21.05.1998]
    R&D Projects: GA ČR GA102/98/1571
    Subject RIV: BM - Solid Matter Physics ; Magnetism
    Permanent Link: http://hdl.handle.net/11104/0029659

     
     

Number of the records: 1  

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