0131531 - FZU-D 980585 RIV NL eng J - Journal Article
Zemek, Josef - Lesiak, B. - Jozvik, A.
Phase distincion in semi/insulating polycrystalline silicon by pattern recognition of X-ray photoelactron spectroscopy/X-ray-induced auger electron spectoscopy data.
Applied Surface Science. Roč. 135, - (1998), s. 318-330. ISSN 0169-4332. E-ISSN 1873-5584
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 1.045, year: 1998

Permanent Link: http://hdl.handle.net/11104/0000530