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What does it take to stabilize a naphthalene anion?
- 1.0598619 - ÚFCH JH 2025 RIV US eng J - Journal Article
Ďurana, Jozef - Kocábková, Barbora - Rakovský, Jozef - Pysanenko, Andriy - Kresin, V. V. - Fedor, Juraj - Fárník, Michal
What does it take to stabilize a naphthalene anion?
Journal of Chemical Physics. Roč. 161, č. 12 (2024), č. článku 124303. ISSN 0021-9606. E-ISSN 1089-7690
R&D Projects: GA ČR(CZ) GA24-11390S; GA MŠMT EH22_008/0004558
Institutional support: RVO:61388955
Keywords : Oxygen evolution * RuO2 * Soft X-ray absorption spectroscopy
OECD category: Physical chemistry
Impact factor: 3.1, year: 2023 ; AIS: 0.908, rok: 2023
Method of publishing: Open access
DOI: https://doi.org//10.1063/5.0230131
We investigate attachment of slow electrons (0-10 eV) to naphthalene (Np) clusters in a crossed beam experiment. Supersonic expansions under different conditions using different buffer gases generate the clusters: in He, Ne, and low pressure Ar, neat (Np)N clusters are formed, while we also observe mixed clusters of naphthalene with rare-gas atoms in co-expansion with Ar above 0.5 bar and with Kr. Negatively charged (Np)n- and Rgm(Np)n- (Rg = Ar, Kr) clusters are analyzed by mass spectrometry, and electron energy dependent ion yields are measured. We show that the smallest stable naphthalene complex with an excess electron, the dimer (Np)2- anion, cannot be formed in a binary collision of a free electron with (Np)2 dimer, nor with (Np)3 trimer. Evaporation of a weakly bound Ar atom(s) from a mixed ArM(Np)2 cluster following electron attachment leads to the dimer (Np)2- anion. Larger (Np)n-, n > 3, transient cluster anions decay via evaporation of an Np unit on a timescale of tens of microseconds. The self-scavenging process opens around 6 eV, where a naphthalene unit is electronically excited by the incoming electron, which is slowed down and trapped. However, the transient negative ion is efficiently stabilized only in the mixed clusters, from which Ar atom(s) can be evaporated. © 2024 Author(s). Published under an exclusive license by AIP Publishing.
Permanent Link: https://hdl.handle.net/11104/0356226
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