Number of the records: 1  

Dataset for Microstructure and physical properties of black aluminum antireflective films.

  1. 1.
    0585608 - FZÚ DATA Scientific data      2024
    Correa, Cinthia Antunes - More Chevalier, Joris - Hruška, Petr - Poupon, Morgane - Novotný, Michal - Minárik, P. - Hubík, Pavel - Lukáč, František - Fekete, Ladislav - Prokop, Dejan - Hanuš, J. - Valenta, J. - Fitl, Přemysl - Lančok, Ján

    Dataset for Microstructure and physical properties of black aluminum antireflective films.

    Description: The files are related to the manuscript „Microstructure and physical properties of Black-Aluminum antireflective films“ and are organized in the sequence of appearance in the manuscript. The nomenclature of the files follows the sequence:
    Figure, number of the figure appearing in the manuscript (from 1 – 7), type of data (XRD, AFM, TEM, EDX, PALS, Reflectance, Carrier concentration, Electrical mobility, or resistivity), thin film sample related to (R-Al or B-Al), film thickness (60, 180, 250, 320, or 410 nm).
    TEM image files are raw, as collected, while the ones in the manuscript were cropped to show the differences between the films.

    Keywords : powder x-ray diffraction * atomic force microscopy * transmission electron microscopy * energy dispersive x-ray analysis * positron annihilation spectroscopy * reflectivity, resistivity * hall measurements
    OECD category: Condensed matter physics (including formerly solid state physics, supercond.); Materials engineering (UFP-V)
    DOI: https://doi.org/10.57680/asep.0585608
    Handle: https://hdl.handle.net/11104/0353281
    Depositor: admin
     
    File DownloadSizeCommentaryAccess
    Data.zip File list4347.5 MBopen-access
    Date of release: 2.5.2024
    Institutional support: RVO:68378271Institutional support: RVO:61389021
    License: CC BY 4.0 - Attribution-International license
     
    ASEP publication:
    Microstructure and physical properties of black-aluminum antireflective films
     
Number of the records: 1  

  This site uses cookies to make them easier to browse. Learn more about how we use cookies.