Laser-induced electron dynamics and surface modification in ruthenium thin films

0582474 - ÚFP 2024 RIV GB eng J - Journal Article
Akhmetov, F. - Milov, I. - Semin, S. - Formisano, F. - Medvedev, Nikita - Sturm, J.M. - Zhakhovsky, V.V. - Makhotkin, I.A. - Kimel, A. - Ackermann, M.
Laser-induced electron dynamics and surface modification in ruthenium thin films.
Vacuum. Roč. 212, June (2023), č. článku 112045. ISSN 0042-207X. E-ISSN 1879-2715
R&D Projects: GA MŠMT(CZ) LM2018114; GA MŠMT LTT17015; GA MŠMT EF16_013/0001552
Grant - others:Ministerstvo školství, mládeže a tělovýchovy - GA MŠk(CZ) LM2018140
Institutional support: RVO:61389021
Keywords : Femtosecond laser damage * Fermi smearing * Pump-probe thermoreflectance * Ruthenium * Thin films * Two-temperature molecular dynamics
OECD category: Fluids and plasma physics (including surface physics)
Impact factor: 4, year: 2022
Method of publishing: Open access
https://www.sciencedirect.com/science/article/pii/S0042207X23002427?via%3Dihub

We performed the experimental and theoretical study of the heating and damaging of ruthenium thin films induced by femtosecond laser irradiation. We present the results of an optical pump-probe thermoreflectance experiment with rotating sample allowing to significantly reduce heat accumulation in irradiated spot. We show the evolution of surface morphology from growth of a heat-induced oxide layer at low and intermediate laser fluences to cracking and grooving at high fluences. Theoretical analysis of thermoreflectance in our pump-probe experiment allows us to relate behavior of hot electrons in ruthenium to the Fermi smearing mechanism. This conclusion invites more research on Fermi smearing of transition metals. The analysis of heating is performed with the two-temperature modeling and molecular dynamics simulation, results of which demonstrate that the calculated single-shot melting threshold is higher than experimental damage threshold. We suggest that the onset of Ru film damage is caused by the heat-induced stresses that lead to cracking of the Ru film. Such damage accumulates during repetitive exposure to light.
Permanent Link: https://hdl.handle.net/11104/0350538