Damage kinetics induced by swift heavy ion impacts onto films of different thicknesses

0579879 - ÚFP 2024 RIV NL eng J - Journal Article
Rymzhanov, R. A. - Medvedev, Nikita - Volkov, A.E.
Damage kinetics induced by swift heavy ion impacts onto films of different thicknesses.
Applied Surface Science. Roč. 566, November (2021), č. článku 150640. ISSN 0169-4332. E-ISSN 1873-5584
R&D Projects: GA MŠMT LTT17015; GA MŠMT EF16_013/0001552
Grant - others:European Cooperation in Science and Technology(BE) CA17126
Program: COST
Institutional support: RVO:61389021
Keywords : Electron emission * Electronic excitation * Nanocluster emission * Surface damage * Swift heavy ion * Thin film
OECD category: Condensed matter physics (including formerly solid state physics, supercond.)
Impact factor: 7.392, year: 2021
Method of publishing: Limited access
https://www.sciencedirect.com/science/article/pii/S0169433221017074?via%3Dihub

Response of CaF2 thin films to swift heavy ions irradiation is studied with Monte-Carlo code TREKIS and molecular dynamics simulations. Two factors affecting the damage kinetics in ion tracks in films of different thickness are considered: electron emission and an effect of the layer thickness. It is shown that escape of electrons from the target surface is important in films thinner than 15 nm and can significantly reduce energy deposited into the lattice. Three different modes of damage realize depending on the layer thickness: a through hole forms in the thinnest layers despite energy loss via electron emission, semispherical and spherical hillocks form at intermediate thicknesses, emission of nanoclusters occurs from thick layers.
Permanent Link: https://hdl.handle.net/11104/0348662