A brief overview of the studies on the irreversible breakdown of LGAD testing samples irradiated at the critical LHC-HL fluences

0566384 - FZÚ 2023 RIV GB eng J - Journal Article
Laštovička-Medin, G. - Kramberger, G. - Rebarz, Mateusz - Andreasson, Jakob - Kropielnicki, Kamil - Laštovička, Tomáš - Kroll, Jiří
A brief overview of the studies on the irreversible breakdown of LGAD testing samples irradiated at the critical LHC-HL fluences.
Journal of Instrumentation. Roč. 17, č. 7 (2022), č. článku C07020. ISSN 1748-0221. E-ISSN 1748-0221
R&D Projects: GA MŠMT(CZ) LM2018141; GA MŠMT EF16_019/0000789; GA MŠMT EF15_003/0000447
Grant - others:OP VVV - ADONIS(XE) CZ.02.1.01/0.0/0.0/16_019/0000789; OP VVV - ELIBIO(XE) CZ.02.1.01/0.0/0.0/15_003/0000447
Institutional support: RVO:68378271
Keywords : charge induction * radiation-hard detectors * solid state detectors * timing detectors
OECD category: Fluids and plasma physics (including surface physics)
Impact factor: 1.3, year: 2022
Method of publishing: Limited access
https://doi.org/10.1088/1748-0221/17/07/C07020

LGAD sensors will be employed in the CMS MTD and ATLAS HGTD upgrades to mitigate the high levels of pile-up expected in the High Luminosity phase of the LHC. Over the last several years, much attention has been focused on designing radiation tolerant gain implants to ensure that these sensors survive the expected fluences, (more than 1–2 × 1015 neq/cm2). However, in test beams with protons and a fs-laser, highly irradiated LGADs operated at a high voltage, have been seen to exhibit violent burn-out events that render the sensors inoperable. This paper will focus on the critical electric field and accordingly the bias thresholds to mitigate the risk of Single Event Burnout (SEB).
Permanent Link: https://hdl.handle.net/11104/0337732