Radiation-induced phase separation in nanostructured Hf-In-C ternary thin films under irradiation with 200 keV Ar.sup.+./sup. ion beam

0562898 - FZÚ 2023 RIV GB eng J - Journal Article
Vacík, J. - Cannavó, A. - Bakardjieva, S. - Kupčík, Jaroslav - Lavrentiev, V. - Ceccio, G. - Horák, P. - Němeček, J. - Verna, A. - Parmeggiani, M. - Calcagno, L. - Klie, R. - Duchoň, Jan
Radiation-induced phase separation in nanostructured Hf-In-C ternary thin films under irradiation with 200 keV Ar⁺ ion beam.
Radiation Effects and Defects in Solids. Roč. 177, 1-2 (2022), s. 137-160. ISSN 1042-0150. E-ISSN 1029-4953
R&D Projects: GA MŠMT LM2018110
Institutional support: RVO:68378271
Keywords : ion beam synthesis * Hf-In-C nanocomposite * Hf₂InC MAX phase * HfC_0.95 phase * radiation tolerance
OECD category: Condensed matter physics (including formerly solid state physics, supercond.)
Impact factor: 1, year: 2022
Method of publishing: Limited access
https://doi.org/10.1080/10420150.2022.2049788

After fabrication the Hf-In-C nanostructures a part of the pristine (as deposited) samplex was irradiated by 200 KeV Ar.+. ions at high fluences 10.15. and 10.17. cm.-2.. Both samples (as prepared and irradiated)were analyzed by IBA nuclear analytical methods, as well as by AFM and TEM microscopic techniques, and by XPS and profilometry to understand the microstructural evolution.
Permanent Link: https://hdl.handle.net/11104/0335067