Real-time spatial characterization of micrometer-sized X-ray free-electron laser beams focused by bendable mirrors

0558653 - FZÚ 2023 RIV US eng J - Journal Article
Mercurio, G. - Chalupský, Jaromír - Nistea, I.T. - Schneider, M. - Hájková, Věra - Gerasimova, N. - Carley, R. - Cascella, M. - Le Guyader, L. - Mercadier, L. - Schlappa, J. - Setoodehnia, K. - Teichmann, M. - Yaroslavtsev, A. - Burian, Tomáš - Vozda, Vojtěch - Vyšín, Luděk - Wild, J. - Hickin, D. - Silenzi, A. - Stupar, M. - Delitz, J.T. - Broers, C. - Reich, A. - Pfau, B. - Eisebitt, S. - La Civita, D. - Sinn, H. - Vannoni, M. - Alcock, S.G. - Juha, Libor - Scherz, A.
Real-time spatial characterization of micrometer-sized X-ray free-electron laser beams focused by bendable mirrors.
Optics Express. Roč. 30, č. 12 (2022), s. 20980-20998. ISSN 1094-4087
R&D Projects: GA ČR(CZ) GA20-08452S; GA MŠMT(CZ) LM2018114
EU Projects: European Commission(XE) 654148 - LASERLAB-EUROPE
Institutional support: RVO:68378271
Keywords : X-ray free-electron laser * real-time spacial characterization of beams * bendable mirrors used
OECD category: Optics (including laser optics and quantum optics)
Impact factor: 3.8, year: 2022
Method of publishing: Open access

A real-time and accurate characterization of the X-ray beam size is essential to enable a large variety of different experiments at free-electron laser facilities. Typically, ablative imprints are employed to determine shape and size of μm-focused X-ray beams. The high accuracy of this state-of-the-art method comes at the expense of the time required to perform an ex-situ image analysis. In contrast, diffraction at a curved grating with suitably varying period and orientation forms a magnified image of the X-ray beam, which can be recorded by a 2D pixelated detector providing beam size and pointing jitter in real time. In this manuscript, we compare results obtained with both techniques, address their advantages and limitations, and demonstrate their excellent agreement. We present an extensive characterization of the FEL beam focused to ≈1 μm by two Kirkpatrick-Baez (KB) mirrors, along with optical metrology slope profiles demonstrating their exceptionally high quality.
Permanent Link: http://hdl.handle.net/11104/0332382