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The Key Role of Tin (Sn) in Microstructure and Mechanical Properties of Ti2SnC (M2AX) Thin Nanocrystalline Films and Powdered Polycrystalline Samples
- 1.0552393 - ÚACH 2023 RIV CH eng J - Journal Article
Bakardjieva, Snejana - Plocek, Jiří - Ismagulov, Bauyrzhan - Kupčík, Jaroslav - Vacík, Jiří - Ceccio, Giovanni - Lavrentiev, Vasyl - Němeček, J. - Michna, Š. - Klie, R.
The Key Role of Tin (Sn) in Microstructure and Mechanical Properties of Ti2SnC (M2AX) Thin Nanocrystalline Films and Powdered Polycrystalline Samples.
Nanomaterials. Roč. 12, č. 3 (2022), č. článku 307. E-ISSN 2079-4991
R&D Projects: GA ČR(CZ) GA18-21677S
Research Infrastructure: CANAM II - 90056
Institutional support: RVO:61388980 ; RVO:61389005
Keywords : M2AX * Nanoindentation * Powders * STEM * Thin films * Ti2SnC
OECD category: Inorganic and nuclear chemistry; Chemical engineering (plants, products) (UJF-V)
Impact factor: 5.300, year: 2022
Method of publishing: Open access
Layered ternary Ti2SnC carbides have attracted significant attention because of their ad-vantage as a M2AX phase to bridge the gap between properties of metals and ceramics. In this study, Ti2SnC materials were synthesized by two different methods—an unconventional low-energy ion facility (LEIF) based on Ar+ ion beam sputtering of the Ti, Sn, and C targets and sintering of a com-pressed mixture consisting of Ti, Sn, and C elemental powders up to 1250 °C. The Ti2SnC nanocrys-talline thin films obtained by LEIF were irradiated by Ar+ ions with an energy of 30 keV to the fluence of 1.1015 cm−2 in order to examine their irradiation-induced resistivity. Quantitative structural analysis obtained by Cs-corrected high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) confirmed transition from ternary Ti2SnC to binary Ti0.98C carbide due to irradiation-induced β-Sn surface segregation. The nanoindentation of Ti2SnC thin nanocrys-talline films and Ti2SnC polycrystalline powders shows that irradiation did not affect significantly their mechanical properties when concerning their hardness (H) and Young’s modulus (E) We high-lighted the importance of the HAADF-STEM techniques to track atomic pathways clarifying the behavior of Sn atoms at the proximity of irradiation-induced nanoscale defects in Ti2SnC thin films.
Permanent Link: http://hdl.handle.net/11104/0327534
File Download Size Commentary Version Access The Key.pdf 8 10.4 MB CC BY licence Publisher’s postprint open-access The Key SI.pdf 5 805.1 KB CC BY licence Publisher’s postprint open-access
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