In situ monitoring of pulsed laser annealing of Eu-doped oxide thin films

0552117 - FZÚ 2022 RIV CH eng J - Journal Article
Novotný, Michal - Remsa, Jan - Havlová, Šárka - More Chevalier, Joris - Irimiciuc, Stefan - Chertopalov, Sergii - Písařík, Petr - Volfová, Lenka - Fitl, Přemysl - Kmječ, Tomáš - Vrňata, M. - Lančok, Ján
In situ monitoring of pulsed laser annealing of Eu-doped oxide thin films.
Materials. Roč. 14, č. 24 (2021), č. článku 7576. E-ISSN 1996-1944
R&D Projects: GA ČR GA18-17834S
Institutional support: RVO:68378271
Keywords : pulsed laser deposition * pulsed laser annealing * zinc oxide * lutetium oxide * titanium oxide * europium * in situ monitoring * photoluminescence
OECD category: Coating and films
Impact factor: 3.748, year: 2021
Method of publishing: Open access

Eu3+ doped oxide thin films possess a great potential for several emerging applications in optics, optoelectronics, and sensors. The applications demand maximizing Eu3+ photoluminescence response. Eu-doped ZnO, TiO2, and Lu2O3 thin films were deposited by Pulsed Laser Deposition (PLD). Pulsed UV Laser Annealing (PLA) was utilized to modify the properties of the films. In situ monitoring of the evolution of optical properties photoluminescence and transmittance) at PLA was realized to optimize efficiently PLA conditions. The changes in optical properties were related to structural, microstructural, and surface properties characterized by X-ray diffraction (XRD)and atomic force microscopy (AFM). The substantial increase of Eu3+ emission was observed for all annealed materials. PLA induces crystallization of TiO2 and Lu2O3 amorphous matrix, while in the case of already nanocrystalline ZnO, rather surface smoothening related grains’ coalescence was observed.
Permanent Link: http://hdl.handle.net/11104/0327271