The EBSD spatial resolution of a Timepix-based detector in a tilt-free geometry

0542399 - ÚFM 2022 RIV NL eng J - Journal Article
Marshall, A. L. - Holzer, Jakub - Stejskal, P. - Stephens, C. J. - Vystavěl, T. - Whiting, M. J.
The EBSD spatial resolution of a Timepix-based detector in a tilt-free geometry.
Ultramicroscopy. Roč. 226, JUL (2021), č. článku 113294. ISSN 0304-3991. E-ISSN 1879-2723
R&D Projects: GA MŠMT(CZ) LQ1601
Institutional support: RVO:68081723
Keywords : EBSD * Direct electron detection * Timepix * Resolution * Normal incidence * Cross-Correlation
OECD category: Materials engineering
Impact factor: 2.994, year: 2021
Method of publishing: Open access
https://www.sciencedirect.com/science/article/pii/S0304399121000826?via%3Dihub

Performing EBSD with a horizontal sample and a parallel EBSD detector sensor, enables safer specimen movements for data collection of large specimen areas and improves the longitudinal spatial resolution. The collection of electron backscattering patterns (EBSPs) at normal incidence to the electron beam has been revisited via the use of a direct electron detection (DED) sensor. In this article we present a fully operational DED EBSD detection system in this geometry, referred to as the tilt-free geometry. A well-defined Σ=3[101]{121} twin boundary in a Molybdenum bicrystal was used to measure the physical spatial resolution of the EBSD detector in this tilt-free geometry. In this study, two separate methods for estimating the spatial resolution of EBSD, one based on a pattern quality metric and the other on a normalised cross correlation coefficient were used. The spatial resolution was determined at accelerating voltages of 8 kV, 10 kV, 12 kV, 15 kV and 20 kV ranging from ~22−38 nm using the pattern quality method and ~31−46 nm using the normalised cross correlation method.
Permanent Link: http://hdl.handle.net/11104/0320611