Characterization of W-type hexaferrite thin films prepared by chemical solution deposition

0541805 - ÚACH 2022 RIV CH eng J - Journal Article
Soroka, Miroslav - Buršík, Josef - Kužel, R. - Prokleška, J. - Aguirre, M.H.
Characterization of W-type hexaferrite thin films prepared by chemical solution deposition.
Thin Solid Films. Roč. 726, MAY (2021), č. článku 138670. ISSN 0040-6090. E-ISSN 1879-2731
R&D Projects: GA ČR(CZ) GA19-06433S; GA MŠMT(CZ) LM2018124
Institutional support: RVO:61388980
Keywords : Chemical solution deposition * Spin reorientation transition * SrCo2-xZnxFe16O27 * Thin films * W-type hexaferrites
OECD category: Inorganic and nuclear chemistry
Impact factor: 2.358, year: 2021
Method of publishing: Limited access
https://doi.org/10.1016/j.tsf.2021.138670

Thin films of W-type hexaferrite were grown on SrTiO3 (111) single crystals using the chemical solution deposition method and metalorganic precursor solutions prepared using the modified Pechini method. The synthesis of single-phase materials required optimizing the initial stoichiometry and crystallization conditions. The results showed that a concurrent excess of alkaline earth metal and deficiency in divalent metal ion (Zn2+ , Co2+ ) favors the synthesis of pure W hexaferrites. This off-stoichiometry suppressed the formation of an exceedingly stable spinel phase at pyrolysis temperatures. The epitaxial nature of thin films, expressed as the orientation relation (00l)w || (111)SrTiO3 and [110]w || [112¯]SrTiO3 and hence the pronounced anisotropy of their magnetic properties as well were established by three dimensional x-ray diffraction texture analysis and magnetization measurements, respectively and enabled to identify the temperature interval in which the characteristic spin reorientation transition occurs for a specific degree of cobalt substitution.
Permanent Link: http://hdl.handle.net/11104/0319750