Microhardness study of Cd1-xZnxTe1-ySey crystals for X-ray and gamma ray detectors

0541344 - ÚFM 2022 RIV NL eng J - Journal Article
Franc, J. - Moravec, P. - Dědič, V. - Roy, U. - Elhadidy, Hassan - Minárik, P. - Šíma, V.
Microhardness study of Cd1-xZnxTe1-ySey crystals for X-ray and gamma ray detectors.
Materials Today Communications. Roč. 24, SEP (2020), č. článku 101014. ISSN 2352-4928. E-ISSN 2352-4928
Institutional support: RVO:68081723
Keywords : single-crystals * cdte * growth * zinc * segregation * selenium * czts * Microhardness * Bandgap * Crystal composition
OECD category: Condensed matter physics (including formerly solid state physics, supercond.)
Impact factor: 3.383, year: 2020
Method of publishing: Limited access
https://www.sciencedirect.com/science/article/pii/S2352492819313601?via%3Dihub

We performed a detailed Vickers microhardness study of quaternary material Cd1-xZnxTe1-ySey (CZTS), which is currently under investigation for applications in the detection of hard X-rays and gamma rays. In this frame, the Vickers microhardness method, resistivity mapping, low-temperature (4.2 K) photoluminescence, and Se energy dispersive X-ray spectroscopy (EDX) composition analysis were employed along the crystal growth axis. The microhardness values measured at 50 g load (HV 0.05), bandgap, and crystal composition along the crystal axis have been correlated. We also performed a comparative study of a set of CdTe, CdZnTe, and CdTeSe samples. We observed a significantly higher microhardness in CZTS crystals when compared to CdZnTe crystals. While in the CdZnTe crystals the microhardness increases by approx. 2.1 HV 0.05 per 1% of Zn + Se content, in CZTS crystals this value is 4.1 HV 0.05. This result indicates a possible additional strengthening of the effect when Zn and Se are mixed in the CdTe lattice.
Permanent Link: http://hdl.handle.net/11104/0322642