Number of the records: 1  

Resonance Production and Decay in Proton and Pion Induced Collisions with HADES

  1. 1.
    0539941 - ÚJF 2021 RIV JP eng C - Conference Paper (international conference)
    Przygoda, W.
    Resonance Production and Decay in Proton and Pion Induced Collisions with HADES.
    JPS Conference Proceedings. Vol. 13. Tokyo: The Physical Society of Japan, 2016, č. článku 010013. ISBN 978-4-89027-114-6.
    [10th International Workshop on the Physics of Excited Nucleons (NSTAR2015). Osaka (JP), 25.05.2015-28.05.2015]
    Research Infrastructure: FAIR-CZ - 90049
    Keywords : HADES * heavy ion collisions
    OECD category: Particles and field physics

    Resonance production and decay in proton-proton collisions at kinetic beam energies of 1.25 GeV and 3.5 GeV as well as r-p reactions at four different pion beam momenta (0.656, 0.69, 0.748 and 0,8 GeV/c) are investigated,lxclusive channels with one pion in the final state (ipm and pp71-1) in the pp collisions were put to extended studies based on various observables in the framework of a one pion exchange model and with solutions obtained within the framework of a partial wave analysis (PWA) of the Bonn-Gatchina group. In the case of the 3.5 GeV data, the study of the ppe+ e- channel gave insight on the dielectron production from 1\f'' and A in the second and third resonance regions. We show that the measured dielectron invariant mass distribution cannot be explained by a point like resonance-y* coupling. Comparison with various transport models unravels the ambiguities of the descriptions and the important role of the intermediate p production. To tackle this problem a systematic investigation focused on the role of N(1520) production and decay in pion induced reactions on polyethylene and carbon targets,lirst results on exclusive channels with one pion (7-p), two pions (n7-'7-) and dileptons (ne(+)e(-)) in the final state are presented.
    Permanent Link: http://hdl.handle.net/11104/0317627

     
     
Number of the records: 1  

  This site uses cookies to make them easier to browse. Learn more about how we use cookies.