Measurements of single event upset in ATLAS IBL

0539534 - FZÚ 2021 RIV GB eng J - Journal Article
Balbi, G. - Barbero, M. - Beccherle, R. - Bindi, M. - Breugnon, P. - Butti, P. - Cinca, D. - Dickinson, J. - Ferrere, D. - Fougeron, D. - Garcia-Sciveres, M. - Pascual, J.G. - Gaudiello, A. - Gemme, C. - Giangiacomi, N. - Hemperek, T. - Jeanty, L. - Kepka, Oldřich - Kocian, M. - Lantzsch, K. - Liu, P. - Martin, C. - Mekkaoui, A. - Menouni, M. - Potamianos, K. - Rozanov, A. - Takubo, Y. - Wensing, M.
Measurements of single event upset in ATLAS IBL.
Journal of Instrumentation. Roč. 15, č. 6 (2020), s. 1-30, č. článku P06023. ISSN 1748-0221. E-ISSN 1748-0221
R&D Projects: GA MŠMT(CZ) LTT17018
Research Infrastructure: CERN-CZ II - 90104
Institutional support: RVO:68378271
Keywords : semiconductor detector: pixel * noise * ATLAS * electronics: readout
OECD category: Particles and field physics
Impact factor: 1.415, year: 2020
Method of publishing: Open access

Effects of Single Event Upsets (SEU) and Single Event Transients (SET) are studied in the FE-I4B chip of the innermost layer of the ATLAS pixel system. SEU/SET affect the FE-I4B Global Registers as well as the settings for the individual pixels, causing, among other things, occupancy losses, drops in the low voltage currents, noisy pixels, and silent pixels. Quantitative data analysis and simulations indicate that SET dominate over SEU on the load line of the memory. Operational issues and mitigation techniques are presented.
Permanent Link: http://hdl.handle.net/11104/0317254