0539468 - ÚJF 2022 RIV GB eng J - Journal Article
Mikšová, Romana - Jagerová, Adéla - Malinský, Petr - Harcuba, P. - Veselý, J. - Holý, V. - Kentsch, U. - Macková, Anna
Multi-direction channelling study of the Ag:YSZ nanocomposites prepared by ion implantation.
Vacuum. Roč. 184, FEB (2021), č. článku 109773. ISSN 0042-207X. E-ISSN 1879-2715
R&D Projects: GA MŠMT LM2015056; GA ČR GA18-03346S
Institutional support: RVO:61389005
Keywords : Ag-ion implantation * Yttria-stabilised zirconia * damage accumulation * strain relaxation * nanoparticles
OECD category: Materials engineering
Impact factor: 4.110, year: 2021
Method of publishing: Limited access
https://doi.org/10.1016/j.vacuum.2020.109773

The paper reports on implantation damage accumulation, Ag distribution and the interior morphology in different crystallographic orientations of implanted samples of cubic yttria-stabilised zirconia (YSZ). (100)-, (110)- and (111)-oriented YSZ was implanted with 400-keV Ag+ ions at ion fluences from 5 x 10(14) to 5 x 10(16) cm(-2). Rutherford backscattering spectrometry (RBS) in the channelling mode (RBS-C), as well as X-ray diffraction (XRD), were used for the quantitative measurement of the lattice disorder and Ag distribution. The defect propagation and Ag accumulation were observed using transmission electron microscopy (TEM) with the energy-dispersive X-ray spectroscopy (EDX). Although similar damage evolution trends were observed along with all channelling directions, the disorder accumulation is lower along the 110 direction than along the 100 and 111 direction. The damage extends much deeper than the theoretically predicted depths. It is attributed to long-range defect migration effects, confirmed by TEM. At the ion fluence of 5 x 10(16) cm(-2), nanometre-sized Ag precipitates were identified in the depth of 30-130 nm based on the Ag concentration-depth profiles determined by RBS.
Permanent Link: http://hdl.handle.net/11104/0317204