Spectral and polarization properties of VUV-mirrors for experiments at a HHG beamline

0538040 - FZÚ 2021 RIV DE eng C - Conference Paper (international conference)
Richter, Steffen - Espinoza Herrera, Shirly J. - Andreasson, Jakob
Spectral and polarization properties of VUV-mirrors for experiments at a HHG beamline.
X-Ray Lasers 2018: Proceedings of the 16th International Conference on X-Ray Lasers. Cham: Springer International Publishing, 2020 - (Kozlová, M.; Nejdl, J.), Roč. 241 (2020), s. 175-179. Springer Proceedings in Physics, 241. ISBN 9783030354527. ISSN 0930-8989.
[International Conference on X-Ray Laser /16./ (ICXRL 2018). Prague (CZ), 07.10.2018-12.10.2018]
R&D Projects: GA MŠMT EF16_019/0000789; GA MŠMT EF15_003/0000447; GA MŠMT LQ1606
Grant - others:OP VVV - ADONIS(XE) CZ.02.1.01/0.0/0.0/16_019/0000789; OP VVV - ELIBIO(XE) CZ.02.1.01/0.0/0.0/15_003/0000447
Institutional support: RVO:68378271
Keywords : ellipsometry * Hall effect * terahertz
OECD category: Fluids and plasma physics (including surface physics)

For polarization-resolved reflection experiments such as ellipsometry, not only is high reflectivity in a wide spectral range required for mirrors but also the quality of their polarization response is important. Furthermore, for VUV ellipsometry, optimal angles of incidence at the sample are between 45 ∘ 45∘ and 60 ∘ 60∘ with respect to the surface normal. In the best case, a setup should even allow variable angles. This requires reflective optics working at non-grazing incidence. In this theoretical study, a selection of potentially relevant materials and mirror designs for broadband use in the VUV is investigated.
Permanent Link: http://hdl.handle.net/11104/0315873