0536755 - ÚPT 2021 RIV US eng J - Journal Article
Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Piňos, Jakub - Radlička, Tomáš - Frank, Luděk - Müllerová, Ilona - Materna Mikmeková, Eliška
Very Low Energy Electron Transmission Spectroscopy of 2D Materials.
Microscopy and Microanalysis. Roč. 26, S2 (2020), s. 2636-2638. ISSN 1431-9276. E-ISSN 1435-8115
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : spectroscopy * very low energy electron transmission * 2D materials
OECD category: Electrical and electronic engineering
Impact factor: 4.127, year: 2020 ; AIS: 0.968, rok: 2020
Method of publishing: Open access
Result website:
https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/very-low-energy-electron-transmission-spectroscopy-of-2d-materials/2F6DF5F745E2CCA1AFA45F451D68BD41DOI: https://doi.org/10.1017/S1431927620022278

Detailed knowledge of mechanisms of electron scattering and its practical consequences for very low energies are of prime importance for not only measurement techniques but also for development of newmaterials for electronic devices of the next generation. Low thickness of 2D materials motivated us to develop unique device analyzing samples via transmitted electrons in a standard microscopic regime and also via time-of-flight (ToF) spectroscopic method.
Permanent Link: http://hdl.handle.net/11104/0314644