Thickness dependence of the anomalous Nernst effect and the Mott relation of Weyl semimetal Co.sub.2./sub.MnGa thin films

0535313 - FZÚ 2021 RIV US eng J - Journal Article
Park, G.H. - Reichlová, H. - Schlitz, R. - Lammel, M. - Markou, A. - Swekis, P. - Ritzinger, Ph. - Kriegner, Dominik - Noky, J. - Gayles, J. - Sun, Y. - Felser, C. - Nielsch, K. - Goennenwein, S.T.B. - Thomas, A.
Thickness dependence of the anomalous Nernst effect and the Mott relation of Weyl semimetal Co₂MnGa thin films.
Physical Review B. Roč. 101, č. 6 (2020), s. 1-7, č. článku 060406. ISSN 2469-9950. E-ISSN 2469-9969
R&D Projects: GA MŠMT EF16_027/0008215; GA ČR(CZ) GX19-28375X; GA MŠMT EF16_013/0001405
EU Projects: European Commission(XE) 766566 - ASPIN
Grant - others:MOBILITY FZU(XE) CZ.02.2.69/0.0/0.0/16_027/0008215; OP VVV - LNSM(XE) CZ.02.1.01/0.0/0.0/16_013/0001405
Institutional support: RVO:68378271
Keywords : spintronics * anomalous Nernst effect
OECD category: Condensed matter physics (including formerly solid state physics, supercond.)
Impact factor: 4.036, year: 2020
Method of publishing: Open access

We report a robust anomalous Nernst effect in Co2MnGa thin films in the thickness regime between 20 and 50 nm.
Permanent Link: http://hdl.handle.net/11104/0313377