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Surface imaging with UHV SLEEM and SEM LEEM
- 1.0522221 - ÚPT 2020 US eng A - Abstract
Mikmeková, Šárka - Jánský, P. - Kolařík, V. - Müllerová, Ilona
Surface imaging with UHV SLEEM and SEM LEEM.
Microscopy and Microanalysis. Cambridge University Press. Roč. 25, S2 (2019), s. 444-445. ISSN 1431-9276. E-ISSN 1435-8115.
[Microscopy & Microanalysis 2019 Meeting. 04.08.2019-08.08.2019, Portland]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : surface imaging * UHV SLEEM * SEM LEEM
OECD category: Materials engineering
From fundamental studies in the materials science up to diagnostics of industrial materials a reliable method enabling characterization of surface properties with high sensitivity and high spatial resolution is urgently needed. Low energy electron microscopy method has proven itself eminently sensitive not only to the topography of the sample surface but also to its chemical composition, crystalline structure and electronic configuration.
Permanent Link: http://hdl.handle.net/11104/0306716
Number of the records: 1