Electron and hole trapping in Eu- or Eu,Hf-doped LuPO.sub.4./sub. and YPO.sub.4./sub. tracked by EPR and TSL spectroscopy

0511346 - FZÚ 2020 RIV GB eng J - Journal Article
Laguta, Valentyn - Buryi, Maksym - Nikl, Martin - Zeler, J. - Zych, E. - Bettinelli, M.
Electron and hole trapping in Eu- or Eu,Hf-doped LuPO₄ and YPO₄ tracked by EPR and TSL spectroscopy.
Journal of Materials Chemistry C. Roč. 7, č. 37 (2019), s. 11473-11482. ISSN 2050-7526. E-ISSN 2050-7534
R&D Projects: GA MŠMT(CZ) EF16_019/0000760; GA MŠMT EF16_013/0001406; GA MŠMT(CZ) LO1409; GA ČR GA17-09933S
Grant - others:OP VVV - SOLID21(XE) CZ.02.1.01/0.0/0.0/16_019/0000760; OP VVV - SAFMAT(XE) CZ.02.1.01/0.0/0.0/16_013/0001406
Institutional support: RVO:68378271
Keywords : electron and hole trapping * EPR * TSL * single crystals * lattice defects
OECD category: Condensed matter physics (including formerly solid state physics, supercond.)
Impact factor: 7.059, year: 2019
Method of publishing: Limited access
https://doi.org/10.1039/c9tc03507a

EPR spectroscopy in X- and Q-bands was employed to trace charge carriers trapping upon exposure to X-rays of LuPO4:Eu, LuPO4:Eu,Hf and YPO4:Eu,Hf flux-grown single crystals, as well as LuPO4:Eu sintered ceramics. These data were complemented with thermoluminescence studies on the same compositions.
Permanent Link: http://hdl.handle.net/11104/0301636