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Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology
- 1.0511240 - FZÚ 2020 RIV NL eng M - Monography Chapter
Fejfar, Antonín - Rezek, Bohuslav - Čermák, Jan
Local current measurements.
Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology. Amsterdam: Elsevier, 2018 - (Klapetek, P.), s. 265-301. Micro and Nano Technologies, 2nd edition. ISBN 978-0-12-813347-7
Institutional support: RVO:68378271
Keywords : atomic force microscopy * local current
OECD category: Condensed matter physics (including formerly solid state physics, supercond.)
https://www.sciencedirect.com/science/article/pii/B9780128133477000108?via%3Dihub
Method of local electric current measurements by an Atomic Force Microscope are presented and described in order to evaluate the measured data quantitatively.
Permanent Link: http://hdl.handle.net/11104/0301569
Number of the records: 1