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Contamination Mitigation Strategy for Ultra-Low Energy Electron Microscopy and Spectroscopy

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    0510308 - ÚPT 2020 US eng A - Abstract
    Materna-Mikmeková, Eliška - Frank, Luděk - Konvalina, Ivo - Müllerová, Ilona - Zhang, T. - Asefa, T.
    Contamination Mitigation Strategy for Ultra-Low Energy Electron Microscopy and Spectroscopy.
    Microscopy and Microanalysis. Roč. 25, S2 (2019), s. 500-501. ISSN 1431-9276.
    [Microscopy & Microanalysis 2019 Meeting. 04.08.2019-08.08.2019, Portland]
    R&D Projects: GA TA ČR(CZ) TN01000008; GA TA ČR TG03010046
    Institutional support: RVO:68081731
    Keywords : ultra-low energy * spectroscopy * contamination mitigation strategy
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    OBOR OECD: Nano-materials (production and properties)

    Perhaps the most straightforward expectation related with ultra-low energy microscopy/spectroscopy is
    the low penetration of electrons into the samples. In general, low energy electrons cause more intense
    contamination than high energy electrons, which can be explained by diminution of the interaction
    volume of electrons inside the samples and increased yield of secondary electrons. Naturally, for a true
    “surface” study, the sample has to be perfectly clean and an in-situ cleaning method should be applied
    on the sample.
    Permanent Link: http://hdl.handle.net/11104/0300817
     
Number of the records: 1