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Studying 2D Materials by Means of Microscopy and Spectroscopy with Low Energy Electrons
- 1.0510307 - ÚPT 2020 US eng A - Abstract
Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Piňos, Jakub - Radlička, Tomáš - Frank, Luděk - Müllerová, Ilona - Materna Mikmeková, Eliška
Studying 2D Materials by Means of Microscopy and Spectroscopy with Low Energy Electrons.
Microscopy and Microanalysis. Cambridge University Press. Roč. 25, S2 (2019), s. 482-483. ISSN 1431-9276. E-ISSN 1435-8115.
[Microscopy & Microanalysis 2019 Meeting. 04.08.2019-08.08.2019, Portland]
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : two-dimensional (2D) materials * microscopy and spectroscopy * low energy electrons
OECD category: Electrical and electronic engineering
Two-dimensional (2D) materials have recently become very popular because of their interesting properties and rich application potential. Progress in production of new high quality 2D materials necessitates to study and analyze these materials. Such studies can be performed via scanning electron microscopy with slow and very slow electrons and time-of-flight (ToF) spectroscopy.
Permanent Link: http://hdl.handle.net/11104/0300816
Number of the records: 1