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Characterization of a-Si:H thin films with and without embedded nanoparticles
- 1.0501964 - FZÚ 2019 CZ eng A - Abstract
Stuchlíková, The-Ha - Remeš, Zdeněk - Stuchlík, Jiří
Characterization of a-Si:H thin films with and without embedded nanoparticles.
Book of Abstracts of the 28th Joint Seminar Development of Materials Science in Research and Education. Praha: Institute of Physics of the Czech Academy of Sciences, 2018 - (Kožíšek, Z.; Král, R.; Zemenová, P.). s. 54-54. ISBN 978-80-905962-8-3.
[Joint Seminar Development of Materials Science in Research and Education /28./. 03.09.2018-07.09.2018, Pavlov]
R&D Projects: GA ČR GC16-10429J
Institutional support: RVO:68378271
Keywords : a-Si:H * PIN diode * thin films * nanoparticles
OECD category: Condensed matter physics (including formerly solid state physics, supercond.)
The basic measurement on diode structures gives as important results the I-V (current voltage) characteristics, which are measured under or without illumination. As well as the control of the Electroluminescence is important. This configuration is called “sandwich
Permanent Link: http://hdl.handle.net/11104/0293932
Number of the records: 1